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Aktive Komponenten

SiC Mosfets

Bild Serie/Typ Hersteller Produktgruppe Artikelkategorie Hauptkategorie Gehäusetyp Sperrspannung [V] RDS on [mOhm] Nennstrom [A] Nennstrom [mA] Produkt Feature Produkt Status
No Image G3R10MT07-CAL GeneSiC Bare Die SiC Mosfets Aktive Komponenten 750 10 100 100000
-G3R™ (3rd Generation) Technology -Low Temperature Coefficient of RDS (ON) -Lower QG and Smaller RG(INT) -Low Device Capacitances (Coss, CRSS) -LoRing™ - Electromagnetically Optimized Design -Superior Cost-Performance Index -Robust Body Diode with Low VF and Low QRR -100% Avalanche (UIL) Tested -Industry-Leading UIL and short-Circuit Robustness

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No Image G3R10MT07-CAU GeneSiC Bare Die SiC Mosfets Aktive Komponenten 750 10 100 100000
-G3R™ (3rd Generation) Technology -Low Temperature Coefficient of RDS (ON) -Lower QG and Smaller RG(INT) -Low Device Capacitances (Coss, CRSS) -LoRing™ - Electromagnetically Optimized Design -Superior Cost-Performance Index -Robust Body Diode with Low VF and Low QRR -Industry-Leading UIL and short-Circuit Robustness

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No Image G4R10MT12-CAU GeneSiC Bare Die SiC Mosfets Aktive Komponenten 1200 10 120 120000
-G4R™ (3rd Generation) Technology -Low Temperature Coefficient of RDS (ON) -Lower QG and Smaller RG(INT) -Low Device Capacitances (Coss, CRSS) -LoRing™ - Electromagnetically Optimized Design -Superior Cost-Performance Index -Robust Body Diode with Low VF and Low QRR -Industry-Leading UIL and short-Circuit Robustness

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No Image G4R10MT12-CAL GeneSiC Bare Die SiC Mosfets Aktive Komponenten 1200 10 120 120000
-G4R™ (3rd Generation) Technology -Low Temperature Coefficient of RDS (ON) -Lower QG and Smaller RG(INT) -Low Device Capacitances (Coss, CRSS) -LoRing™ - Electromagnetically Optimized Design -Superior Cost-Performance Index -Robust Body Diode with Low VF and Low QRR -Industry-Leading UIL and short-Circuit Robustness

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No Image G3R12MT12-CAL GeneSiC Bare Die SiC Mosfets Aktive Komponenten 1200 12 100 100000
-G3R™ (3rd Generation) Technology -Softer RDS (ON) v/s Temperature dependency -LoRing™ - Electromagnetically Optimized Design -Lower QG and Smaller RG(INT) -Low Device Capacitances (Coss, CRSS) -Superior Cost-Performance Index -Robust Body Diode with Low VF and Low QRR -Industry-Leading UIL and short-Circuit Robustness

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No Image G3R20MT12-CAL GeneSiC Bare Die SiC Mosfets Aktive Komponenten 1200 20 60 60000
-G3R™ (3rd Generation) Technology -Softer RDS (ON) v/s Temperature dependency -LoRing™ - Electromagnetically Optimized Design -Smaller RG(INT) and Lower QG -Low Device Capacitances (Coss, CRSS) -Superior Cost-Performance Index -Robust Body Diode with Low VF and Low QRR -Industry-Leading UIL and short-Circuit Robustness

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No Image G3R30MT12-CAL GeneSiC Bare Die SiC Mosfets Aktive Komponenten 1200 30 45 45000
-G3R™ (3rd Generation) Technology -Softer RDS (ON) v/s Temperature dependency -LoRing™ - Electromagnetically Optimized Design -Smaller RG(INT) and Lower QG -Low Device Capacitances (Coss, CRSS) -Superior Cost-Performance Index -Robust Body Diode with Low VF and Low QRR -Industry-Leading UIL and short-Circuit Robustness

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No Image G3R20MT17-CAL GeneSiC Bare Die SiC Mosfets Aktive Komponenten 1700 20 75 75000
-G3R™ Technology with +15 V Gate Drive -Softer RDS (ON) v/s Temperature dependency -LoRing™ - Electromagnetically Optimized Design -Smaller RG(INT) and Lower QG -Low Device Capacitances (Coss, CRSS) -Superior Cost-Performance Index -Robust Body Diode with Low VF and Low QRR -Industry-Leading UIL and short-Circuit Robustness

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No Image G3R45MT17-CAL GeneSiC Bare Die SiC Mosfets Aktive Komponenten 1700 45 35 35000
-G3R™ Technology with +15 V Gate Drive -Softer RDS (ON) v/s Temperature dependency -LoRing™ - Electromagnetically Optimized Design -Smaller RG(INT) and Lower QG -Low Device Capacitances (Coss, CRSS) -Superior Cost-Performance Index -Robust Body Diode with Low VF and Low QRR -Industry-Leading UIL and short-Circuit Robustness

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No Image G2R50MT33-CAL GeneSiC Bare Die SiC Mosfets Aktive Komponenten 3300 50 50 50000
-Softer RDS (ON) v/s Temperature dependency -LoRing™ - Electromagnetically Optimized Design -Smaller RG(INT) and Lower QG -Low Device Capacitances (Coss, CRSS) -Superior Cost-Performance Index -Robust Body Diode with Low VF and Low QRR -Normally Off-stable temperature up to 175° C -Industry-Leading UIL and short-Circuit Robustness

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No Image G2R300MT65-CAL GeneSiC Bare Die SiC Mosfets Aktive Komponenten 6500 300 10 10000
-G2R™ Technology with +20 V / -5 V Gate Drive -Superior QG X RDS (ON) Figure of Merit -Low Capacitances and Low gate charge -Normally Off-stable operation up to 175° C -Fast and reliable body Diode -High Avalanche and short circuit Ruggedness -Low condition Losses at High Temperature

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No Image G2R325MS65-CAL GeneSiC Bare Die SiC Mosfets Aktive Komponenten 6500 325 10 10000
-G2R™ Technology with +20 V / -5 V Gate Drive -Superior QG X RDS (ON) Figure of Merit -Low Capacitances and Low gate charge -Normally Off-stable operation up to 175° C -Fast and Reliable Integrated Schottky Diode -High Avalanche and short circuit Ruggedness -Low condition Losses at High Temperature

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No Image GP2T020A120X-SBT SemiQ Bare Die SiC Mosfets Aktive Komponenten sawn on blue tape 1200 20
in production
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SemiQ GP2T020A120X GP2T020A120X SemiQ Bare Die SiC Mosfets Aktive Komponenten unsawn wafer 1200 20
in production
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No Image GP2T040A120X-SBT SemiQ Bare Die SiC Mosfets Aktive Komponenten sawn on blue tape 1200 40
in production
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SemiQ GP2T040A120X GP2T040A120X SemiQ Bare Die SiC Mosfets Aktive Komponenten unsawn wafer 1200 40
in production
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No Image GP2T080A120X-SBT SemiQ Bare Die SiC Mosfets Aktive Komponenten sawn on blue tape 1200 80
in production
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SemiQ GP2T080A120X GP2T080A120X SemiQ Bare Die SiC Mosfets Aktive Komponenten unsawn wafer 1200 80
in production
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